Leakage Tester Nei

  • RK2675AM/ RK2675WM/ RK2675B/ RK2675C/ RK2675D/ RK2675E/ RK2675WT Leakage Current Tester

    RK2675AM / RK2675WM / RK2675B / RK2675C / RK2675D / RK2675E / RK2675WT Leakage Tester Nei

    Oloa Faʻatomuaga O le RK2675 Series Leakage Nei Tester O loʻo faʻaaogaina mo le fuaina o le leakage o loʻo gaosia e le malosiaga faʻaeletise (poʻo isi malosiaga) e ala i le faʻaaogaina poʻo tufatufaina Parameter Impedance, e le fesoʻotaʻi ma le galuega, o le suʻega meafaigaluega lea fuaina le insulativity O Eletise Meafaigaluega Ma O Le Saogalemuina Galuega O Oloa. Lenei Oloa Faʻamalieina O Totonu ma Faʻavaomalo Saogalemuʻu Tulaga Tofotofogaina O GB4706.1-2005, IEC60335.1-2004 Ma isi mea, I le tausisia ...
  • RK9950 Program Controlled Leakage Current Tester

    RK9950 Polokalame Faʻatonutonu Leakage Tester Nei

    Oloa Aotelega O le Programmable Leakage Nei Tester O Se 5-Inch TFT LCD Faʻaalia. Le Tester Adopts 32-Bit High-Speed ​​MCU And Large-Scale Digital Circuit Design, Fausia I le GB9706.1-2007 (IEC60601-1: 1998) Tino Impedance Simulation Network, O le Card MD Network Interface o loʻo aofia ai MD-A (I Le laina Faʻatasi ma GB / T12113-2003 Ma GB4793.1-2007) 、 MD-B (ogatasi ma GB / T12113-2003 、 GB4793.1-2007 、 GB4706.1-2005 、 GB4943.1-2011 、 GB8898-2011 、 GB7000.1 -2015) 、 MD-C (ogatasi ma GB / T12113-2003 、 GB7000.1-2015) 、 MD-D (A ...
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